2026-06-11T22:38:30Zhttps://riubu.ubu.es/oai/request

oai:riubu.ubu.es:10259/110872025-11-21T01:05:39Zcom_10259_5822com_10259_5086com_10259_2604col_10259_5823

Ruiz Fernández, Virginia Liljeroth, Peter Quinn, Bernadette M. Kontturi, Kyösti 2025-11-20T13:50:36Z 2025-11-20T13:50:36Z 2003-10 1530-6984 https://hdl.handle.net/10259/11087 10.1021/nl034633y 1530-6992 An advanced electroanalytical technique, scanning electrochemical microscopy (SECM), is used as a new approach to measure both the lateral (in-plane) and cross-film electron transport in multilayer polymer/nanoparticle films. The sensitivity of SECM is such that the conductivity of a single nanoparticle monolayer can be quantified. The increase in SECM tip current with the number of polyelectrolyte/nanoparticle layer pairs demonstrates that the subsequent layers are not electrically insulated from each other and that there is significant communication between nanoparticles in different layers. eng info:eu-repo/semantics/openAccess Electrical conductivity Layers Nanoparticles Redox reactions Thin films Probing Conductivity of Polyelectrolyte/Nanoparticle Composite Films by Scanning Electrochemical Microscopy info:eu-repo/semantics/article