2026-05-07T22:21:06Zhttps://riubu.ubu.es/oai/request

oai:riubu.ubu.es:10259/111932026-01-12T07:55:44Zcom_10259_4393com_10259_5086com_10259_2604col_10259_4394

Dieste Velasco, Mª Isabel 149 600 0000-0002-2077-2097 2026-01-09T13:02:31Z 2026-01-09T13:02:31Z 2025-10 0923-8174 https://hdl.handle.net/10259/11193 10.1007/s10836-025-06202-5 1573-0727 The determination of measurement uncertainty is of paramount importance in defining the range of values assigned to a given response variable. In electronic circuits, this is a challenging task that still needs further development. Difficulties associated with repeated measurements and the inherent variability of components make it difficult to determine uncertainty unless a large number of measurements are taken, which increases costs. Furthermore, due to the strong nonlinear characteristics of most electronic circuits and the difficulty in determining a differentiable expression, it is not feasible to apply uncertainty propagation. An alternative for modeling uncertainty is the Monte Carlo method, as proposed by the Guide for the Expression of Measurement Uncertainty (GUM and GUM-S1). However, when the probability distribution of the response variables significantly deviates from normal, the GUM-S1 method may lead to inaccurate results. This study proposes a new Monte Carlo-based method to quantify measurement uncertainty in electronic circuits and includes a comparative study of GUM, GUM-S1, and the proposed method. It is shown that uncertainty can be determined more accurately with the proposed method when normality cannot be assumed. The proposed method is applied to two analog circuits: a Sallen-Key filter and a low-signal amplifier. Open access funding provided by FEDER European Funds and the Junta de Castilla y León under the Research and Innovation Strategy for Smart Specialization (RIS3) of Castilla y León 2021-2027. Open access funding provided by the CRUE-CSIC agreement with Springer Nature, the FEDER European Funds, and the Junta de Castilla y León under the Research and Innovation Strategy for Smart Specialization (RIS3) of Castilla y León 2021–2027. application/pdf eng Springer Journal of Electronic Testing. 2025, V. 41, n. 5-6, p. 651-629 https://doi.org/10.1007/s10836-025-06202-5 Atribución 4.0 Internacional http://creativecommons.org/licenses/by/4.0/ info:eu-repo/semantics/openAccess Uncertainty Electronic circuits Monte Carlo analysis Electrónica Circuitos electrónicos Electronics Electronic circuits Enhanced Monte Carlo-Based Uncertainty Quantification in Electronic Circuits info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion Journal of Electronic Testing 41 5-6 615 629 THUMBNAIL Dieste-joet_2025.pdf.jpg Dieste-joet_2025.pdf.jpg IM Thumbnail image/jpeg 4653 https://riubu.ubu.es/bitstream/10259/11193/4/Dieste-joet_2025.pdf.jpg ab8b21fd4541bb41891911663f13ec6e MD5 4 LICENSE license.txt license.txt text/plain; charset=utf-8 999 https://riubu.ubu.es/bitstream/10259/11193/3/license.txt b295bcbce42e2caabeb0c623d3860c06 MD5 3 CC-LICENSE license_rdf license_rdf application/rdf+xml; charset=utf-8 908 https://riubu.ubu.es/bitstream/10259/11193/2/license_rdf 0175ea4a2d4caec4bbcc37e300941108 MD5 2 ORIGINAL Dieste-joet_2025.pdf Dieste-joet_2025.pdf application/pdf 3034116 https://riubu.ubu.es/bitstream/10259/11193/1/Dieste-joet_2025.pdf 36df99659bf94ac2d1fd049790542ec5 MD5 1 10259/11193 oai:riubu.ubu.es:10259/11193 2026-01-12 08:55:44.23 Repositorio Institucional de la Universidad de Burgos bubrep@ubu.es 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