TY  - JOUR 
AU  - Dieste Velasco, Mª Isabel
PY  - 2025
SN  - 0167-9260
UR  - https://hdl.handle.net/10259/10838
AB  - Analog circuits are commonly used in a wide range of industrial applications, and their assessment is of great importance to ensure proper functionality and prevent faults. However, this task is not as fully developed and is significantly less...
LA  - eng
PB  - Elsevier
KW  - Soft fault diagnosis
KW  - Fault classification
KW  - Machine-learning
KW  - Electronic circuits
KW  - Electrónica analógica
KW  - Analog electronic systems
TI  - Soft fault diagnosis in analog electronic circuits using supervised machine learning
DO  - 10.1016/j.vlsi.2025.102482
T2  - Integration
VL  - 104
M2  - 102482
ER  -