TY  - JOUR 
AU  - Ruiz Fernández, Virginia
AU  - Liljeroth, Peter
AU  - Quinn, Bernadette M.
AU  - Kontturi, Kyösti
PY  - 2003
SN  - 1530-6984
UR  - https://hdl.handle.net/10259/11087
AB  - An advanced electroanalytical technique, scanning electrochemical microscopy (SECM), is used as a new approach to measure both the lateral (in-plane) and cross-film electron transport in multilayer polymer/nanoparticle films. The sensitivity of SECM...
LA  - eng
PB  - American Chemical Society
KW  - Electrical conductivity
KW  - Layers
KW  - Nanoparticles
KW  - Redox reactions
KW  - Thin films
KW  - Nanotecnología
KW  - Nanotechnology
KW  - Microscopía
KW  - Microscopy
KW  - Electroquímica
KW  - Electrochemistry
TI  - Probing Conductivity of Polyelectrolyte/Nanoparticle Composite Films by Scanning Electrochemical Microscopy
DO  - 10.1021/nl034633y
T2  - Nano Letters
VL  - 3
M2  - 1459
ER  -