2026-05-30T16:28:07Zhttps://riubu.ubu.es/oai/request

oai:riubu.ubu.es:10259/110872025-11-21T01:05:39Zcom_10259_5822com_10259_5086com_10259_2604col_10259_5823

Ruiz Fernández, Virginia Liljeroth, Peter Quinn, Bernadette M. Kontturi, Kyösti 2025-11-20T13:50:36Z 2025-11-20T13:50:36Z 2003-10 1530-6984 https://hdl.handle.net/10259/11087 10.1021/nl034633y 1530-6992 An advanced electroanalytical technique, scanning electrochemical microscopy (SECM), is used as a new approach to measure both the lateral (in-plane) and cross-film electron transport in multilayer polymer/nanoparticle films. The sensitivity of SECM is such that the conductivity of a single nanoparticle monolayer can be quantified. The increase in SECM tip current with the number of polyelectrolyte/nanoparticle layer pairs demonstrates that the subsequent layers are not electrically insulated from each other and that there is significant communication between nanoparticles in different layers. This work is funded by the National Technology Agency, Finland, and the EU under the Sixth Framework Program (“SUSANA”, EU TMR network “Supramolecular Self-Assembly of Interfacial Nanostructures”, contract number HPRN-CT-2002-00185). application/pdf eng American Chemical Society Nano Letters. 2003, V. 3, n. 10, p. 1459–1462 https://doi.org/10.1021/nl034633y Electrical conductivity Layers Nanoparticles Redox reactions Thin films Nanotecnología Microscopía Electroquímica Nanotechnology Microscopy Electrochemistry Probing Conductivity of Polyelectrolyte/Nanoparticle Composite Films by Scanning Electrochemical Microscopy info:eu-repo/semantics/article info:eu-repo/semantics/acceptedVersion info:eu-repo/semantics/openAccess Nano Letters 3 10 1459 1462