TY  - JOUR 
AU  - Dieste Velasco, Mª Isabel
PY  - 2021
UR  - http://hdl.handle.net/10259/8682
AB  - In this study, machine learning techniques based on the development of a pattern–recognition neural network were used for fault diagnosis in an analog electronic circuit to detect the individual hard faults (open circuits and short circuits) that may...
LA  - eng
PB  - MDPI
KW  - Modeling
KW  - Analog circuits
KW  - Fault diagnosis
KW  - Neural networks
KW  - Ingeniería eléctrica
KW  - Electric engineering
KW  - Ingeniería mecánica
KW  - Mechanical engineering
TI  - Application of a Pattern-Recognition Neural Network for Detecting Analog Electronic Circuit Faults
DO  - 10.3390/math9243247
T2  - Mathematics
VL  - 9
ER  -